Gain and Read Noise

The conversion gain of the camera and the readnoise was measured by the following procedure:

The inverse slope of the line gives the conversion gain of the chip The intercept gives the readout noise.

A measurement was taken using the Fowler sampling with the following results.

Fitting one more point at higher signal level than shown above leads to differing results.

Gain Discussion

We can convert the conversion gain into the signal by following the signal chain which has the following characteristics: Hence 1 e- corresponds to about 1 microvolt. This is a factor of two lower than mean value of the range (1.5 - 2.5 µ V/e -) quoted on the Rockwell Specification Sheet. I don't know if this indicates some problem in the measurement,however, there are other reasons to be suspicious of this value.

Noise Discussion

The noise resulting from the difference of two Fowler frames is pretty white as the next image shows.

The Frame method of reading the chip used above is subject to the fluctuations in the reset value. From the responsivity of 1.0 microvolt per electron leads to a result that the capacity of the detector is 0.16pF. From thermal considerations the average energy in the capacitor = (1/2)*k*T. Since the energy in the capacitor is = (1/2) * C * V 2 . We calculate that the rms voltage at 100K is about 100 microvolts or about 100 e-. This is less than the difference in the two results above.

System Noise

If one grounds the input to the data acquisition system the rms variation is on the order of 1.0 DN.

Taking the difference of two highly saturated images leads to a single frame variance of about 2.8 DN. The image at the right shows the noise pattern: Which is a pretty white.


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Last Revised September 13, 2000